Index by clause number¶
Every test in GB 38031-2025, sorted by clause number. Use this when you have a clause citation and need to find the corresponding wiki page.
For the same data grouped by domain (engineer's view), see All tests at a glance.
Cell-level tests (8.1)¶
| Method clause | Pass criteria | Test | Wiki page |
|---|---|---|---|
| 8.1.2 | 5.1.1 | Over-discharge | open |
| 8.1.3 | 5.1.2 | Overcharge | open |
| 8.1.4 | 5.1.3 | External short circuit | open |
| 8.1.5 | 5.1.4 | Heating | open |
| 8.1.6 | 5.1.5 | Temperature cycling | open |
| 8.1.7 | 5.1.6 | Compression (extrusion) | open |
| 8.1.8 🆕 | 5.1.7 | Safety after fast-charge cycles | open |
Pack/system tests (8.2)¶
| Method clause | Pass criteria | Test | Wiki page |
|---|---|---|---|
| 8.2.1 | 5.2.1 | Vibration | open |
| 8.2.2 | 5.2.2 | Mechanical shock | open |
| 8.2.3 | 5.2.3 | Simulated collision | open |
| 8.2.4 | 5.2.4 | Compression (pack) | open |
| 8.2.5 | 5.2.5 | Damp heat cycling | open |
| 8.2.6 | 5.2.6 | Immersion | open |
| 8.2.7.1 | 5.2.7 a) | External fire | open |
| 8.2.7.2 + App. C | 5.2.7 b) | Thermal propagation ⭐ | open |
| 8.2.8 | 5.2.8 | Temperature shock | open |
| 8.2.9 | 5.2.9 | Salt fog | open |
| 8.2.10 | 5.2.10 | High altitude | open |
| 8.2.11 | 5.2.11 | Over-temperature protection | open |
| 8.2.12 | 5.2.12 | Over-current protection | open |
| 8.2.13 | 5.2.13 | External short-circuit protection | open |
| 8.2.14 | 5.2.14 | Overcharge protection | open |
| 8.2.15 | 5.2.15 | Over-discharge protection | open |
| 8.2.16 🆕 | 5.2.16 | Bottom impact | open |
Other clauses¶
| Clause | Topic | Wiki page |
|---|---|---|
| 1 | Scope | What this standard covers |
| 2 | Normative references | Referenced standards |
| 3 | Terms and definitions | Glossary |
| 4 | Symbols and abbreviations | Symbols and abbreviations |
| 5.1 | Cell safety requirements | (per-test pages) |
| 5.2 | Pack/system safety requirements | (per-test pages) |
| 6.1.1 | Test environment | Test environment |
| 6.1.5 | Insulation testing | Insulation resistance procedure |
| 6.1.6 | Subsystem as test object | Using a subsystem |
| 6.1.7 | SOC adjustment method | Setting SOC |
| 6.1.10 | Default test SOC (highest working) | Setting SOC |
| 6.2 | Instrument accuracy | Test environment |
| 6.3 | Process errors | Test environment |
| 6.4 | Data recording | Test environment |
| 7.1 | Cell test preparation | Pre-treatment cycles |
| 7.2 | Pack/system test preparation | Pre-treatment cycles |
| 9 | Same type determination | Same type determination |
| 9.2 / Table 7 | Partial-change retesting | Retesting (Table 7) |
| 10 | Implementation timeline | When it takes effect |
| Appendix A | Typical pack/system structures | Typical structures |
| Appendix B | Insulation resistance test method | Insulation resistance procedure |
| Appendix C | Thermal propagation analysis & verification | Thermal Propagation deep dive |
Source: GB 38031-2025 (PDF p. 1–39).